Si-NIR Matrix-DVK

The Si-NIR Matrix Development Kit (DVK) Evaluation Set is used by OEMs, system developers, and engineers to evaluate, prototype, and test the Si-NIR Matrix sensor—a miniaturized FT-NIR spectrometer designed for analyzing complex, non-uniform materials in real-time.
It is specifically designed for:
Quick Evaluation & Testing: Assessing the Si-NIR Matrix sensor’s ability to handle specific, real-world, non-uniform, or heterogeneous materials using a plug-and-play setup.
Rapid Prototyping: Accelerating the development of handheld or inline material analyzers for industries such as agriculture, food, pharmaceuticals, and polymer sorting. De-risking Integration: Allowing developers to test the sensor’s 10 mm measurement spot and 1,350–2,550 nm spectral range in their application environment before committing to high-volume production.
Data Collection & Model Training: Using the included software (Si-Spect) to collect, manage, and analyze spectral data to build chemometric models.
The kit is generally used to analyze solids, powders, and liquid samples, particularly where materials are inconsistent and require a larger, more robust, and accurate scanning spot.

The Si-NIR Matrix Development Kit (DVK) is a complete, ready-to-use platform for evaluating and prototyping with Si-Ware’s Si-NIR Matrix sensor. It is designed for benchtop testing and rapid integration into handheld or embedded instruments. The DVK simplifies near-infrared material analysis by combining integrated hardware, software (Si-Spect Analyze), and connectivity into a single plug-and-play solution.

Si-NIR Matrix-DVK DVC10002-0X Plug-and-play toolkit for quick evaluation and prototyping of heterogeneous material analysis.

Si-NIR Matrix DVK Evaluation Set
Evaluation and Development kits for Si-NIR Matrix sensor enabling integration, prototyping, and experimentation with the sensor in lab or ﬁeld environments.

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Description

Product Summary
The Si-NIR Matrix Development Kit (DVK) is a complete, ready-to-use platform for evaluating and prototyping with Si-Ware’s Si-NIR Matrix sensor. It is designed for benchtop testing and rapid integration into handheld or embedded instruments. The DVK simplifies near-infrared material analysis by combining integrated hardware, software (Si-Spect Analyze), and connectivity into a single plug-and-play solution.
It also enables users to obtain lab-grade, repeatable measurements on heterogeneous samples without the need for custom optics or electronics. This accelerates the process of testing the sensor’s fit for
different applications and optimizing system design. Covering the 1,350–2,550 nm spectral range, the DVK can be used to analyze different materials and parameters across diverse domains such as agriculture, biomedicine, industrial polymers, and environmental monitoring.

Applications
The Si-NIR Matrix DVK can be utilized in various use cases such as laboratory, robotic platforms, drones, and smart machinery to enable advanced material analysis across multiple sectors, including:
Agriculture: Analysis of carbon, moisture, and macronutrients in soil and plants.
● Industrial & Polymers: Plastic, resin, and chemical composition analysis.
● Environmental Monitoring: Water and waste material screening.
● Textiles: Identification and characterization of natural and synthetic fibers.
● Fuel & Biofuel: Assessment of composition and identification of different fuels.
● Biomedicine & life sciences: Solid and liquid bio-sample characterization.

Key Features
● Plug-and-play evaluation platform : Integrated optics, electronics, and software for rapid setup and testing.
● Flexible sampling interfaces: Supports interchangeable accessories for repeatable measurements of solids, powders, and liquids.
● Broad NIR coverage (1,350–2,550 nm) : Enables measurements on diverse materials and parameters with high spectral fidelity.
● Large-spot sampling (≥ 10 mm) : Suitable for homogeneous and heterogeneous samples.
● Easy integration: Designed with flexible connectivity and mechanical fixation points for simple and secure mounting in various systems.
● Lightweight design: Ideal for use in space-constrained or mobile environments where size and weight are critical.

Specification

Parameter	Value	Unit	Condition
Performance Specifications
Spectral Range	1,350 – 2,550	nm	Upper and lower limits guarantee SNR ≥ 170:1 across spectral range, 2 s scan.
Wavelength Accuracy	≤ ± 2.3	nm	@λ = 1,681.4 nm; absorbance level = 0.8 A. U, reference material: polystyrene, 2 s scan.
Resolution	16 66.6	nm cm -1	FWHM criterion at λ=1,550 nm
Typical SNR	≥ 2,000:1		@λ 2250 nm, PTFE sample in direct contact with optical window, 2 s scan time
Wavelength Repeatability	≤ ± 0.45	nm	@λ = 1,681.4 nm; absorbance level = 0.8 A.U, reference material: polystyrene, 2 s scan.
Diameter Of Collected Light Beam	≥ 10	mm	Sample in direct contact with optical window.
Bulb lifetime	≥ 10,000	Hours
Electrical Specifications
Voltage	15 VDC 9-24 VDC	V V	USB-C PD (Power Delivery) Terminal block
Power Consumption	~4 ~20	Watt	Stand-by mode Active mode, lamps ON
	Mechanical Specifications
Weight	310	g
Dimensions	75x60x81	Mm3
Environmental Specifications
Operating Temperature	-5: 40	ºC

System Interfaces
This section outlines the Si-NIR Matrix DVK’s hardware interfaces, covering its Optical, mechanical and
electrical connections, and integration notes.
Optical Interface
● Design: Free-space illumination and collection through the optical head.
● Measurement mode: Direct-contact diffuse reflectance via the optical window.
● Performance: Optimal when sample contacts the window; signal decreases with distance.
● Sampling area: Supports ≥10 mm spot size for consistent measurements.

Electrical Interface
● USB Option : USB-C Port 1 – Data connection | USB-C Port 2 – Power Delivery (USB PD) 15 V DC / 3 A.
● Ethernet Option : Ethernet 100BASE-TX (2 pairs, RJ45 with integrated magnetics) | Power via terminal block 9–24 V DC | External connector included.

Integration Notes
The Si-NIR Matrix DVK supports integration into lab, prototype, and embedded setups. The notes below
summarize key mechanical, electrical, and grounding considerations.
● Mechanical Alignment & Mounting : Features eight M3 mounting holes (four top, four
side) that provide secure and flexible installation .
● Electrical & data connections:
● Option 1 (USB): Connector strain-relief should be maintained for reliable operation.
● Option 2 (Ethernet): Proper polarity and cable retention should be ensured during connection.
● Both interfaces should not be used simultaneously.
● Grounding & noise : Designed for use with protective-earth outlets to reduce electrical noise and ensure compliance with safety standards .

Accessories
A range of accessories enables quick and easy evaluation of various sample types, enhancing the Si-NIR
Matrix DVK’s flexibility for application-specific measurements.

Example Measurements
The Si-NIR Matrix DVK was evaluated using a polystyrene sheet, an MRC-910–1920x reference material, and talc powder to demonstrate measurement capability across the 1,350–2,550 nm range. The overlaid reflection spectra show distinct spectral features for each sample at 66.6 cm⁻¹ resolution. A background (calibration) measurement was performed using a standard ceramic tile.