X-Ray Diffraction

An X-ray diffractometer, often referred to as XRD (X-ray diffraction) instrument, is a scientific device used to analyze the crystalline structure of materials by measuring the diffraction of X-rays.

The vast majority of solid materials are crystals or quasicrystals, which can produce characteristic diffraction of X-rays. By recording these diffractions in a proper way, different patterns of X-ray diffraction patterns can be obtained. It can be said that the X-ray diffraction pattern of each substance carries a wealth of information about the structure of the substance. By analyzing these patterns, the structure of the sample can be studied and determined. “Structure” here includes the elemental composition, composition, structure, organization, structure, state, and other meanings of material materials.

With the continuous advancement of technology, XRD analysis has now been widely used in product inspection, raw material quality standards, and production processes.

  1. Rated power: 3kW
  2. Tube voltage: 10-60kV
  3. Tube current: 5-80mA ;
  4. X-ray tube: glass tube, ceramic tube, ripple ceramic tube: Cu, Fe, Co, Cr, Mo etc,
  5. Power 2kW ; Focus size: 1 x 10mm or 0.4 x 14mm or 2 x 12mm
  6. Radius of diffraction: 185mm
  7. Goniometer structure: Horizontal ( θ2 θ)
  8. Minimal stepping angle: 1/1000°


X-Ray Diffraction Instrument
TR-XRD-3K Series diffractometer is designed for materials research and industrial products analysis. It is the perfect combination of conventional analysis with special-purpose measurement products.
The perfect combination of hardware and software systems meets the needs of academics and researchers in different application areas.
High precision diffraction angle measurement system obtains more accurate results
High stability of the X-ray generator control system gets more stable repeatability precision Programmable operation, integrated structure design, easy operation, elegant outlook.


  1. X-ray Diffraction (XRD) is a versatile test instrument to reveal the crystal structure and chemical information:
    Unkown samples in a variety of phase identification
  2. Mixed samples with known quantitative phase analysis
  3. Crystal structure analysis
  4. Crystal structure changes under Unconventional conditions (high temperature, low-temperature conditions)
  5. Analysis of material surface film
  6. Analysis of metal material texture and stress
  7. Analysis of metal material texture and stress


                                                               MODEL: TR-XRD-3K

Rated power


Tube voltage


Tube current


X-ray tube

Glass tube, ceramic tube, ripple ceramic tube: Cu, Fe, Co, Cr, Mo etc, Power 2kW

Focus size

1 x 10mm or 0.4 x 14mm or 2 x 12mm



Goniometer structure

Horizontal ( θ-2 θ)

Radius of diffraction


Scanning range


Scanning speed

0.0012° – 70° min

Max. revolving speed

100° /min

Scanning fashion

θ-2θ linkage, θ、2θ single action; continuous or stepping scanning

Angle repeatable accuracy


Minimal stepping angle



Proportional counters(PC) or scintillation counters(SC)

Maximal counting rate of linearity

5 x 105CPS ( with the compensate function of drop out counting )

Energy resolution ratio

≤25% (PC)、≤50% (SC)

Counting fashion

Differential coefficient or integral, PHA automatically, Dead time regulate

Stability of system measure


Scattered rays dose

≤1 μ Sv/h ( without X-ray protective device )

Instrument integrative stability


Figure size

1100 x 850 x 1750mm


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