X-Ray Diffraction

An X-ray diffractometer, often referred to as XRD (X-ray diffraction) instrument, is a scientific device used to analyze the crystalline structure of materials by measuring the diffraction of X-rays.

The vast majority of solid materials are crystals or quasicrystals, which can produce characteristic diffraction of X-rays. By recording these diffractions in a proper way, different patterns of X-ray diffraction patterns can be obtained. It can be said that the X-ray diffraction pattern of each substance carries a wealth of information about the structure of the substance. By analyzing these patterns, the structure of the sample can be studied and determined. “Structure” here includes the elemental composition, composition, structure, organization, structure, state, and other meanings of material materials.

With the continuous advancement of technology, XRD analysis has now been widely used in product inspection, raw material quality standards, and production processes.

Rated power: 3kW
Tube voltage: 10-60kV
Tube current: 5-80mA ;
X-ray tube: glass tube, ceramic tube, ripple ceramic tube: Cu, Fe, Co, Cr, Mo etc,
Power 2kW ; Focus size: 1 x 10mm or 0.4 x 14mm or 2 x 12mm
Radius of diffraction: 185mm
Goniometer structure: Horizontal ( θ2 θ)
Minimal stepping angle: 1/1000°

Add to wishlist

Category: Chromatography Tags: X-Ray Diffraction, xrd

Description
Reviews (0)

Description

X-Ray Diffraction Instrument
TR-XRD-3K Series diffractometer is designed for materials research and industrial products analysis. It is the perfect combination of conventional analysis with special-purpose measurement products.
The perfect combination of hardware and software systems meets the needs of academics and researchers in different application areas.
High precision diffraction angle measurement system obtains more accurate results
High stability of the X-ray generator control system gets more stable repeatability precision Programmable operation, integrated structure design, easy operation, elegant outlook.

CATALOG X-RAY DIFRRACTION

X-ray Diffraction (XRD) is a versatile test instrument to reveal the crystal structure and chemical information:
Unkown samples in a variety of phase identification
Mixed samples with known quantitative phase analysis
Crystal structure analysis
Crystal structure changes under Unconventional conditions (high temperature, low-temperature conditions)
Analysis of material surface film
Analysis of metal material texture and stress
Analysis of metal material texture and stress

SPECIFICATION

MODEL: TR-XRD-3K
Rated power	3kW
Tube voltage	10-60kV
Tube current	5-80mA
X-ray tube	Glass tube, ceramic tube, ripple ceramic tube: Cu, Fe, Co, Cr, Mo etc, Power 2kW
Focus size	1 x 10mm or 0.4 x 14mm or 2 x 12mm
Stability	≤0.01%
Goniometer structure	Horizontal ( θ-2 θ)
Radius of diffraction	185mm
Scanning range	0-164
Scanning speed	0.0012° – 70° min
Max. revolving speed	100° /min
Scanning fashion	θ-2θ linkage, θ、2θ single action; continuous or stepping scanning
Angle repeatable accuracy	1/1000°
Minimal stepping angle	1/1000°
Detector	Proportional counters(PC) or scintillation counters(SC)
Maximal counting rate of linearity	5 x 10⁵CPS ( with the compensate function of drop out counting )
Energy resolution ratio	≤25% (PC)、≤50% (SC)
Counting fashion	Differential coefficient or integral, PHA automatically, Dead time regulate
Stability of system measure	≤0.01%
Scattered rays dose	≤1 μ Sv/h ( without X-ray protective device )
Instrument integrative stability	≤0.5%
Figure size	1100 x 850 x 1750mm